Download e-book for iPad: Beam instrumentation and diagnostics by Peter Strehl

By Peter Strehl

ISBN-10: 3540264019

ISBN-13: 9783540264019

This treatise covers all points of the layout and the day-by-day operations of a beam diagnostic procedure for a wide particle accelerator. a really interdisciplinary box, it comprises contributions from physicists, electric and mechanical engineers and computing device specialists alike so one can fulfill the ever-increasing calls for for beam parameter variability for an unlimited diversity of operation modi and particles.The writer attracts upon forty years of analysis and paintings, so much of them spent because the head of the beam diagnostics crew at GSI. He has illustrated the extra theoretical facets with many real-life examples that might offer beam instrumentation designers with rules and instruments for his or her paintings.

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Combining experimental results [49, 50] with theoretical considerations, a practical formula has been derived [51]. 24) where • D [MeV/X0 ] is the closely approximated average energy loss by collision (dW/dx)coll , provided that the primary electron is completely stopped in the initial absorber; • X0 [g/cm2 ] is the radiation length (see Chap. 3, eq. 24); • σ [1/X 0 ] is the minimum photon-absorption coefficient of the absorber material. 25 X0 [51]; • W0 is the primary energy of the electrons; • t [X0 ] is the thickness of the stopper plate in units of X0 ; and • x [X0 ] is the thickness of the absorbing lead cylinder in units of X0 .

17), m is the number of strips and δt is the width of the strips, composing the bunch. 15) has to be performed. The result is if (t) = e γβcR2 2 1 P (m) m 3 R2 . 18) 2 + [γβc(t + m δt)] Perhaps the best illustration of the effect is to consider a bunch of square shape. The weights P (m) are constant in this case and defined by P (m) = ∆t /(N + 1) with ∆t as the bunch length and N (−N/2 ≤ m ≤ N/2) as the number of sampling points. It follows immediately that δt = ∆t/N . On the left-hand side, Fig.

As becomes clear from Fig. 12, the advanced field depends strongly on the β value and may be neglected for higher β s, especially looking only at the bunch shape. 10), the geometric design of a broadband Faraday cup with a definitive impedance is less critical for signals with rise times of the order of some nanoseconds. 14 shows the model of a broadband Faraday cup, provided to measure the shape of bunches with rise times of some nanoseconds. Due to the high requirements concerning the power loss in the cup, the design was determined mainly by thermal considerations.

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Beam instrumentation and diagnostics by Peter Strehl

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